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Dual Beam Focused Ion Beam (FIB)

  • Scios 2 LoVac Dual Beam FIB/SEM

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Transmission Electron Microscopy - TEM

  • Philips CM200 FEG 

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AFM - Atomic Force Microscopy

  • ICON, Bruker

Interferometer microscope

  • Bruker / Contour GTIM-BASE

Contact

CSEM SA

Centre Suisse d'Electronique et de Microtechnique SA

Jaquet-Droz 1

Case Postal

CH-2002 Neuchâtel

 

​Additive Manufacturing & Component Reliability

Olha Sereda

Email: Olha.Sereda@csem.ch

T +41 32 720 54 37

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