Transmission Electron Microscopes
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JEOL JEM-ARM200F
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JEOL JEM 2200FS
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JEOL JEM 2010
Focused Ion Beam FIB/SEM
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Zeiss NVision40
Techniques available at EMF
JEM-ARM200F
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imaging including low dose and HRTEM
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selected area electron diffraction, convergent beam electron diffraction
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hollow cone illumination (conical DF)
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high resolution STEM (ADF, BF, ABF, e-ABF)
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low mag STEM
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SE/BSE
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atomic resolution EDX
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room temperature and cryo-electron tomography
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automation in TEM with SerialEM
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variety of room temperature holders as well as a compatibility with cryo holders
JEM 2200FS
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imaging including low dose and HRTEM
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selected area electron diffraction, convergent beam electron diffraction
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in-column omega energy filter
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cryo-electron tomography
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single particle cryo-electron microscopy
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semi- automated and automated data acquisition with SerialEM
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variety of cryo holders
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hollow cone illumination (conical DF)
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Lorentz microscopy
JEM 2010
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imaging including HRTEM
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selected area electron diffraction, convergent beam electron diffraction
NVision
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SEM imaging
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STEM imaging (for very thin samples)
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EDX
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Ga-ion milling
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deposition of C, Pt and SiO
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Slice & view
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micro-manipulation
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cryo shuttle (VCT100, Leica) and cryo stage (Leica)
Contact
Electron Microscopy Facility
Paul Scherrer Institut
Forschungsstrasse 111
5232 Villigen PSI
Switzerland
​
Dr. Elisabeth Agnes Müller Gubler
E-Mail: elisabeth.mueller@psi.ch
T: +41 56 310 54 11
​